Vol. 12, Issue 7 (2023)

Author(s):
Guda Manasa, Nidhi Dubey, Sateesh Reddy Kaluvai and Harshal Avinashe

Abstract:
A study was conducted on 47 wheat genotypes in the Research Farm of the Department of Genetics and Plant Breeding, School of Agriculture, Lovely Professional University, Punjab. The study examined yield and yield-attributing traits using the Augmented Design method. The study investigated deeper into analyzing genetic variability, path coefficient analysis and correlation analysis to understand better the underlying factors influencing wheat production. The harvest index showed significant GCV and PCV values. High heritability and high genetic advance observed by traits such as days to maturity indicating improvement for these traits can be made through direct selection, high heritability and low genetic advance noted by spike length, days to 50% heading, canopy temperature and chlorophyll content. Harvest index and no of productive tillers plant^-1 had a positive (+ve) correlation with grain yield per plant and days to maturity had a negative (-ve) correlation. The path coefficient analysis showed positive (+ve) direct effect on grain yield plant^-1 by Harvest index, biological yield per plant, days to 50% heading and spike length.