Vol. 12, Issue 8 (2023)

Author(s):
SB Thawari, VV Kalpande, RB Ghorade and AR Gulhane

Abstract:
The experimental research was work out to observe the correlation among the traits related to grain mold resistance in kharif sorghum (Sorghum bicolor (L.) Moench). Experiment was conducted using ten diverse patents and forty-five F₁ crosses, generated by crossing these ten diverse parents in half diallel mating design without reciprocals and evaluated for grain mold resistance traits. The study revealed that, threshed grade mold rating (TGMR) shows significant negative correlation with grain hardness, grain density, germination percentage and significantly positive correlation with water absorption capacity, electrical conductivity of grain leachates, FGMR, fungal load of F. moniliforme, fungal load of C. lunata. and also, for other mold fungi. Thus, the selection for grain hardness and grain density would simultaneously improve the germination percentage of seed and reduce the fungal load, FGMR, TGMR, electrical conductivity of grain leachates and water absorption capacity. Hence, these traits could be contemplated as useful traits, for ameliorating grain mold resistance.