Vol. 12, Issue 9 (2023)

Author(s):
Abhishek K Gowda, SA Desai, Suma S Biradar, IK Kalappanavar and MB Chetti

Abstract:
The significance of genetic resources lies in their crucial role in enhancing the quality of crop varieties, particularly in terms of their ability to withstand both biological and environmental stresses. Spot blotch (SB) is a devastating leaf disease affecting wheat, predominantly found in warm and humid regions, particularly in the eastern parts of South Asia. The most effective strategy for managing this disease is the creation of wheat cultivars that are resistant to it. As a result, the current study aimed to validate the resistance to SB in 127 emmer wheat germplasm accessions. This validation was based on both observable traits and genetic characteristics. These accessions were sourced from the International Center for Agricultural Research in the Dry Areas in Lebanon International Maize and Wheat Improvement Center in Mexico and the International Maize and Wheat Improvement Center (CIMMYT) in Mexico. The evaluation for Spot blotch resistance took place in the field under controlled conditions of disease prevalence during the years 2020–21 and 2021–22. This evaluation included two vulnerable control cultivars (DDK-1025 and Sonalika) and two confirmed resistant control cultivars (Chirya-3 and HI-8663). Out of the 127 germplasm accessions tested, forty exhibited resistance to SB, which was further confirmed through a specific genetic marker called Xgwm120. Among these, four accessions – Acc. GPM Dicoccom-IR-76, Acc. GPM Dicoccom-IR-98, Acc. GPM Dicoccom-IR-102, and ICARDA- 14-127687 – demonstrated even greater resistance than the widely recognized Spot blotch- resistant genotype, Chirya-3. These lines with resistance potential hold promise for wheat breeders aiming to develop SB-resistant wheat varieties.