Vol. 12, Issue 12 (2023)

Author(s):
YS Borde, Dr. JD Deshmukh, Dr. HV Kalpande, SL Lagad, VS Chavan and Mohammedi Begum

Abstract:
Mutation was induced in sorghum genotype ‘TSV-32’ with the help of electron beam. Mutants from different five mutagenic treatments viz., T₁ (100 Gy), T₂ (200 Gy), T₃ (300 Gy), (400 Gy) and (500 Gy) were electron beam treatments with two control treatments viz., T₅ (wet control) and T₆ (dry control) were evaluated for correlation and path analysis for the grain yield and some of the independent traits. Association studies indicated that days to maturity, number of primaries, Number of grains per primaries, panicle length, panicle width, 100 seed weight, leaf area and flag leaf area showed significantly positive correlation with grain yield per plant at both genotypic and phenotypic levels. Genotypic correlation magnitude was higher than phenotypic correlation. Partitioning of yield and yield components at both phenotypic and genotypic levels into direct and indirect effects revealed that the characters that had positive direct effects on grain yield were days to 50% flowering, 100 seed weight at both genotypic and Phenotypic level. On grain yield indicating importance of these characters hence, due consideration should be given to these characters while planning a breeding strategy by utilizing rabi sorghum.